Micrel Semiconductor Wafer Fab Division process capabilities. Micrel
continually reviews and updates its process and production capabilities as part of our commitment to keep pace with the leading edge of the
semiconductor industry. For information on the Company’s most current processes and capabilities, contact your local Micrel sales representative.
MEMS Processes

MEMS-only or CMOS+MEMS integrated processing

Inkjet; inertial, pressure, Hall, optical and infrared sensors;
microphones, resonators, TSV

Electrostatic actuators, capacitive and piezoresistor sensors

0.5μ stepper lithography with front-to-back side alignment

Stitching capability for large die

SOI (Silicon on Insulator)

Thick epi-silicon

Doped/undoped polysilicon

Thermal, LPCVD and PECVD oxide

LPCVD and PECVD (low stress) nitride

State-of-the-art DRIE etch on SPTS Pegasus

KOH etch

CMOS-compatible metals; thin and thick metal dry etch

Coming soon: XeF2, anhydrous HF release
CMOS Processes

Numerous digital and analog Si-gate technologies, from 0.35μ/3.3V to 16μ/45V

Stitching capability for large die

Anisotropically-etched contacts, down to 0.4μ

Anisotropically-etched poly, pitch down to 0.9μ (.45μ/.45μ)

Dry-etched metal, pitch down to 1.2μ

CMOS metal gate technology, down to 5μ/12V

Double- or triple-poly technology

Nitride-on-oxide poly-to-poly capacitors

LDD/NLDD processes for higher voltages

DDD processes for higher voltages

1μ, 2μ, 3μ and 5μ extended-drain for higher voltage

Buried- and surface-channel CCD

Single- and double-poly EEPROM technology

Gate oxides, down to 70A

Military–style nitride-on–oxide metal gate technology

Rad–tolerant CMOS Si-gate technologies

Transient-upset protected CMOS (neutron-irradiation)

N on N+ CMOS for latch-up protection

P on P+ CMOS for latch-up reduction

Retrograde P-well and N-well for latch-up reduction

Optical sensors with nitride-type anti-reflective coating

Extended-drain CMOS for high voltage (160V)

Dielectric isolation capability/experience

Buried-contact for buried-poly-via capability

CMOS-type bipolar technology and buried Zeners

Plasma nitride passivation

Ink-jet CMOS process technology

15Ω to 1MΩ/sq poly resistors (stabilized)

Low-noise processes

Low-leakage processes

Contrast-enhanced-material lithography

Zener-trim cells

Zener-trim
BiCMOS Processes

Metal-gate CMOS with power NPNs and PNPs

Option to add metal-gate LDMOS with no additional masks

In P-well, Si-gate, or metal-gate CMOS technologies, a highperformance vertical PNP (separate collector) may be added with one additional
N-base mask and is supported by predefined macros.

In P-well, Si-gate CMOS technology, a lateral NPN with good Beta and
separate collector may be used and is supported by predefined macros.

BiCMOS options are available which are fully-isolated (such as bipolar);
just N-EPI on N+ starting material, or "No EPI"
Bipolar Processes

Bipolar processes from 5μ epi/15V to 10μ epi/170V

Schottky diodes available with AlSiCu or TiSi2/TiN

Resistor heater module

Optical sensors with nitride-type anti-reflective coating

Dielectric isolation capability/experience

Plasma-nitride passivation

Poly-interconnect, resistor or fi eld-plate option

Washed-emitter technology

Poly-emitter technology

Characterized up/down isolation technology

Complementary bipolar

5μ thick metal dry-etch capability

Low-noise processes

Low-leakage processes

Zener-trim cells

Implanted buried layer
DMOS Processes

Discrete devices up to 2GHz and up to 300 Watts

Dual-well metal-gate DMOS/CMOS technology to 80V

D.I. version of DMOS/CMOS

Lateral (Si-gate or metal-gate) or vertical DMOS
Micrel Si-Gate Bipolar/CMOS/DMOS (BCD)

DMOS/HVPCH and bipolar transistors: 50V, 100V or 200V

High-voltage CMOS: 45V

6V, 7V, 8V Zeners/buried Zeners

Pre-tested analog/digital macros

5VIN to 200VOUT translators

H-bridge capability (all-VDMOS)

Double-poly high-voltage nitride-on oxide capacitor technology

Depletion devices

High-voltage resistors: 100V/200V

High-efficiency voltage tripler

Stabilized bandgap references

Over-temperature/over-voltage capability

Sense-FET capability (on-chip)

Latch-up-proof process

LDMOS and VDMOS on same wafer

High-voltage (100V/200V) gate VDMOS option

Option for no-body-effect on VDMOS or HPCH